Semiconductor Inspection
Semiconductor Inspection
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CIS inspector
This equipment detects various stain defects (black wire, black spot, white spot, etc.) during the color filter and Micro Lens process using the optical meter, and it is a device that can detect Defocus in the Micro Lens process.
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Wafer Ink Marking
Equipment that automatically marks the defective chip part of Wafer. Equal Ink Dot Marking, variable Ink Dot size from 125um to 700um, takes up to 2-3 minutes to improve productivity. Using vision, inspection of the location and size of the dotted ink
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Pad inspector (Automatic probe cheker)
It is an equipment that inspects probe stain which is on Pad using optical system, automatically detects abnormality of Probe. Moreover, this equipment automatically analyzes the Probe Card Align status or the status of each probe, and simultaneously inspects the particle around the pad, analyzes the Fuse image, and detects whether it has been accurately repaired.